THE ANALYSIS OF THE CLASSIFICATION ACCURACY OF THE ELECTRONIC COMPONENTS FOR THE SPACE EQUIPMENT DEPENDING ON THE FORECASTING TIME 

Mishanov Roman Olegovich, candidate of technical sciences, assistant, sub-department of design and technology electronic systems and devices, Samara University (443086, 34 Moskovskoe highway, Samara, Russia), E-mail: kipres@ssau.ru 

621.382 

10.21685/2307-4205-2019-4-12 

Background. The article is devoted to the analysis of the research test results of Zener diodes and chips samples with the purpose of potentially defective components rejecting. The article deals with the information of the investigation tests assignment, development of the investigation tests program of the integrated circuits. The communication of teaching experiment and investigation tests is specified. Tasks of each stage of the method are marked. The major destabilizing factors influencing on the integrated circuits operation are stated. On the example of the integrated circuits selection the application of the test program is shown, the studied parameters are determined, the most informative parameters are set. Mathematical models of personal forecasting for the researched selection on the basis of the received test results are given.
Materials and methods. The method of discriminant functions and the method of regression models are chosen as methods of individual forecasting of the components state.
Results and conclusions. Based on the obtained models, the probabilistic characteristics are determined for each selected forecasting time. 

individual forecasting, sample, research test, discriminant function, regression model, forecasting parameter, informative parameter, error variance, Zener diode, chip, forecasting time